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DTSTART;TZID=Europe/Prague:20260721T160000
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SUMMARY:Safety by design: X and Y Interference suppression capacitors for power line filters
DESCRIPTION:Safety by design: X and Y Interference suppression capacitors for power line filters\nWürth Elektronik webinar \nTuesday\, July 21st 2026 @ 4:00PM CEST \nCapacitors are essential components in power line filters\, ensuring reliable interference suppression and electrical safety. In applications connected directly to mains power\, these components must meet strict regulatory and performance requirements defined by standards such as IEC 60384‑14. \nThis webinar provides an overview of the newest developments in safety‑certified capacitors designed for modern power electronics\, including new products in our portfolio like Y2 film capacitors and THB X2 Capacitors. We will also highlight recent regulatory updates\, clarify their impact on design choices\, and share practical guidance for selecting the right capacitor to achieve EMC compliance.
URL:https://passive-components.eu/event/safety-by-design-x-and-y-interference-suppression-capacitors-for-power-line-filters/
LOCATION:virtual
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BEGIN:VEVENT
DTSTART;TZID=Europe/Prague:20260728T080000
DTEND;TZID=Europe/Prague:20260728T110000
DTSTAMP:20260701T121142Z
CREATED:20260701T121142Z
LAST-MODIFIED:20260701T121142Z
UID:76611-1785225600-1785236400@passive-components.eu
SUMMARY:Post Procurement Testing of EEE Components for LEO Space Applications
DESCRIPTION:Post Procurement Testing of EEE Components for LEO Space Applications\nJoin ALTER TECHNOLOGY webinar on optimized test flows for EEE components in LEO applications. \nJuly 28th 2026 at 11:00 CET \n  \nThis technical session will address the rationale behind preparing and implementing optimized test flows for EEE components procured off the shelf as Space\, Military\, or Commercial Quality Level parts for Low Earth Orbit missions. \nThe webinar will present non-traditional test flow approaches compared with official NASA/ESA space specifications for these quality levels. Their implementation remains under the full responsibility of the user and must be assessed according to each mission’s technical requirements. \nThe session will also discuss a component selection and approval policy that gives first priority to COTS solutions. Depending on the specific component type and the available supporting database\, engineering judgement may take precedence over the general policy or the proposed test flow. \nTwo generations of test flows will be presented: \n\n1st Generation: a test flow supported by two and a half decades of successful space heritage.\n2nd Generation: a proposed optimized test flow based on lessons learned from the use of COTS in space\, as technically interpreted by the author.\n\nRegister now to discover how optimized\, experience-based test flows can support more efficient and technically sound component selection for LEO missions. \n\n\nAgenda or topics to be covered during the session.\n\n\n\n\nThe webinar addresses the technical rational for preparing and implementing optimized test flows for EEE Components\, procured off the shelf as Space\, Military\, Commercial Quality Level for LEO applications. The presented test flows are non-traditional vs. the official NASA/ESA Space Specs dedicated to all the above-mentioned quality levels. The test flows and their implementation are under full responsibility of the user. \nThe policy of the selection and approval of the to be flown components is based on first-priority given to COTS. \nCase by case\, as per a specific component type and/or related supporting database\, engineering judgement may take precedence over the general mentioned policy and or the related test flow. \nTwo generations of test flows are presented: \nGen\, 1 a test flow with two and a half decades of successful space heritage. \nGen.  2 a proposed test flow optimized as per lessons learnt from use of COTS in space\, as technically (not politically biased) understood by the author\, as user. \n\n\n\n\nThe webinar addresses the technical rational for preparing and implementing optimized test flows for EEE Components\, procured off the shelf as Space\, Military\, Commercial Quality Level for LEO applications. The presented test flows are non-traditional vs. the official NASA/ESA Space Specs dedicated to all the above-mentioned quality levels. The test flows and their implementation are under full responsibility of the user. \nThe policy of the selection and approval of the to be flown components is based on first-priority given to COTS. \nCase by case\, as per a specific component type and/or related supporting database\, engineering judgement may take precedence over the general mentioned policy and or the related test flow. \nTwo generations of test flows are presented: \nGen\, 1 a test flow with two and a half decades of successful space heritage. \nGen.  2 a proposed test flow optimized as per lessons learnt from use of COTS in space\, as technically (not politically biased) understood by the author\, as user. \nThe addressed issues are: \n\nThe task of traditional 100% testing.\nThe burden of COTS post procurement testing falls on the user.\nGlobal Developments leading away from the traditional methodology.\nThe need for Cultural Change to use advanced technologies\, penalized by the traditional thinking.\nNew approach is needed.\nNew Methodology is needed.\nPost Procurement activities and their scope.\nSampling vs. 100% testing.\nStatistical Process Control (SPC) targeting failures prevention.\nDecision making\, overcoming risk fear.\nElimination of justified non-value-added (NVA) testing.\nTesting activities for the relevant quality levels.\nTests addressing quality vs. tests addressing reliability.\nGen. 2 vs. Gen. 1 DPA test flow for passive.\nGen. 2 vs. Gen. 1 DPA test flow for hermetic active.\nGen. 2 vs. Gen. 1 DPA test flow for PEMs.\nGen. 1 Upscreening Test Flow for all Components\, except semiconductors.\nGen\, 1 Upscreening Test Flow for semiconductors\, except PEMs.\nGen. 1 Upscreening Test Flow for PEMs.\nGen. 2 Upscreening Test Flow.\nUpscreening sampling.\nDPA sampling.\nConclusions.\nSummary.\n\nPresenter: Dan Friedlander\, EEE Components industry consultant.
URL:https://passive-components.eu/event/post-procurement-testing-of-eee-components-for-leo-space-applications/
LOCATION:virtual
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DTSTART;TZID=Europe/Prague:20260729T173000
DTEND;TZID=Europe/Prague:20260729T183000
DTSTAMP:20260715T094259Z
CREATED:20260715T094259Z
LAST-MODIFIED:20260715T094259Z
UID:76881-1785346200-1785349800@passive-components.eu
SUMMARY:To Ferrite or to Nanocrystalline in Transformer Design
DESCRIPTION:To Ferrite or to Nanocrystalline in Transformer Design\nFrenetic Webinar \nWednesday\, July 29\, 5:30 PM \nChoosing the right magnetic core material is a key part of transformer design. With nanocrystalline materials now widely available alongside ferrites\, designers face new opportunities\, and new trade-offs. \nIn this webinar\, Sam Ben-Yaakov will compare ferrite and nanocrystalline cores by reviewing the fundamentals of transformer design and explaining how core material properties influence performance. The session will cover saturation flux density\, core losses\, and the effects of frequency and duty cycle\, before concluding with practical guidelines for selecting the most suitable core technology based on performance\, operating limits\, and cost. \nWe will cover: \n\nThe fundamentals of ferrite and nanocrystalline transformer design.\nHow saturation flux density and core losses affect performance.\nThe influence of frequency and duty cycle on design choices.\nPractical guidelines for selecting the most suitable core technology.\n\nSpeaker: \nSam Ben-Yaakov\nPower Electronics Expert\n\nBioProf. Sam Ben-Yaakov is an IEEE Life Fellow and Professor Emeritus at Ben-Gurion University of the Negev\, internationally recognized for his contributions to power electronics. He has authored over 350 technical papers\, holds more than 40 patents\, and has over 45 years of experience in research\, industry\, and engineering education. He currently serves as Chief Innovation Officer at IRP Systems and shares educational content with thousands of engineers through his YouTube channel.
URL:https://passive-components.eu/event/to-ferrite-or-to-nanocrystalline-in-transformer-design/
LOCATION:virtual
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BEGIN:VEVENT
DTSTART;TZID=Europe/Prague:20260929T160000
DTEND;TZID=Europe/Prague:20260929T170000
DTSTAMP:20260713T073006Z
CREATED:20260713T073006Z
LAST-MODIFIED:20260713T073006Z
UID:76842-1790697600-1790701200@passive-components.eu
SUMMARY:Cybersecurity 2026
DESCRIPTION:Cybersecurity 2026: CRA Requirements\, Emerging Threats & Live Q&A for Electronics Engineers\nWürth Elektronik Webinar \nTuesday\, September 29th 2026 @ 4:00PM CEST\n\n2026 marks a pivotal year for cybersecurity in electronic product development. With the Cyber Resilience Act (CRA) entering its first operational phase\, manufacturers and developers must prepare for new legal obligations — including the requirement to report actively exploited vulnerabilities starting 11 September 2026. At the same time\, the EU is introducing additional measures to strengthen cybersecurity resilience\, streamline certification\, and improve security across digital products and services.   \n\n\n\n\nIn this free live webinar\, experts from Würth Elektronik and NMi TESTLAB will provide a clear\, practical overview tailored for electronics engineers:  \n\nThe key regulatory changes and milestones coming into effect in 2026\nWhat the CRA means for electronics and IoT product development\nRequirements for vulnerability management\, SBOMs\, and design‑phase security\nCurrent cybersecurity trends\, risks\, and real‑world examples\nLive Q&A — your questions answered directly by industry specialists\n\nWhether you develop embedded systems\, IoT devices\, or electronics with digital components\, this session equips you with the knowledge you need to stay compliant and secure in 2026 and beyond.
URL:https://passive-components.eu/event/cybersecurity-2026/
LOCATION:virtual
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