Reliability Issues with Polymer and MnO2 Tantalum Capacitors for Space Applications

Alexander Teverovsky, Jacobs Engineering, Inc, NASA GSFC published presentation that provides a comparative analysis of degradation processes, failure modes and mechanisms in MnO2 and polymer technology tantalum capacitors. Analyzed conditions include effects of vacuum and radiation ,soldering (pop-corning), long-term storage, operation at high temperatures, stability at low and high temperatures, and anomalous transients. Screening and qualification procedures to assure space-grade quality of conductive polymer tantalum capacitors (CPTCs) are suggested.

Advantages and Disadvantages of Conductive Polymer Tantalum Capacitors for Space Applications

breakdown failure mode of MnO2 tantalum capacitor

Advantages

  • Better volumetric efficiency (smaller case sizes);
  • Higher operating voltages (up to 125V);
  • Lower ESR (milliohm range);
  • A relatively safe failure mode (no ignition);
  • Radiation hardness is similar to MnO2 parts (up to 5 MradSi).
breakdown failure mode of polymer tantalum capacitor

Disadvantages

  • Variety of materials and processes for cathode formation;
  • Desorption of moisture in vacuum can be a benefit or a hazard;
  • Intrinsic ESR degradation processes at high temperatures;
  • A new phenomena: anomalous transients;
  • S&Q system developed for MnO2 capacitors is not sufficient due to new failure and degradation mechanisms.

Effect of Moisture

Failures after Soldering

Effect of Vacuum

Drying in vacuum has a similar effect as drying in air:

Life Testing of Tantalum Polymer Capacitors

Recommendation for Specification & Qualification

General

  • CPTCs should be preconditioned before qualification testing.
  • Life testing, HTS, and TS should be carried out using capacitors soldered per specified MSL.
  • Testing for FR is not necessary for the following reasons:
    • Field failures rarely happen at life test conditions;
    • Uncertainty in AFs creates orders of magnitude errors in FR;
    • Due to derating, actual FRs are orders of magnitude below the mission requirements;
    • Most microcircuits that has been successfully used for space are non-ER components.


Screening (Gr.A) should include:

  • Surge current testing. The existing MIL-PRF-55365 requirements limiting maximum current after 1 mseccan be used for CPTCs.
  • Burning-in at 105 ºC 1.1VR for 40 hours.

LAT (or gr. B qualification test) should include:

  • Life testing at 105 ºC, 1.1VR for 1000 hr.
  • High temperature storage test, 1000 hrat 125 ºC.
  • Thermal shock, 100 cycles between -55 and +125 ºC.
  • Testing after baking at 125 ºC for 168 hours:
    • Surge current test at -55 ºC, 25 ºC, and +85 ºC.
    • Stability at low and high temperatures (including DCL at low temperatures).
    • Power cycling 100 cycles at RT and 0.75VR (5 sec ON/OFF using a power supply capable of rising voltage in less than 1 msec).


Summary

Specific features of polymer compared to MnO2 capacitors include:

  • Greater sensitivity to the absence of moisture.
  • Intrinsic mechanism of ESR degradation during high T storage or operation in presence of oxygen.
  • Anomalous transient phenomena.
  • Smaller probability of catastrophic, short circuit failures.
  • Increased probability of noisy behavior.


Space systems would benefit from using CPTCs if:

  • Selected parts pass space-level screening and qualification testing.
  • Operating voltage is deratedto 50% VR.
  • Application conditions are analyzed regarding possible effects of AT especially at low T (special testing is necessary for missions requiring cold start-ups).

see the presentation link below:

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