Low k-material toughens up

Source: Nanotechweb.org news Low dielectric constant (or low-k) materials are promising for faster, smaller and higher performance electronics devices. However, most low-k materials available today are very porous, which makes them mechanically weak and unstable at high temperature. A team of researchers in the US and Korea has now made a 3D nano-architectured dielectric material […]

COTS in space: the 100 percent testing risk

source: Intelligent Aerospace article November 13, 2017  By Dan Friedlander, Retired following 44 years in component engineering The current European Space Agency (ESA) and National Aeronautics and Space Administration (NASA) approach to the use of Electrical, Electronic, and Electromechanical (EEE) commercial off-the-shelf (COTS) components in space applications continues to rely on heavy testing requirements. The official methodology […]

Component Shortages to Last ‘Longer Than Expected’

source: EPS news There’s no short-term relief ahead for electronics manufacturers that are scrambling for components. Tight supplies of capacitors and resistors are expected to last into mid-2018—longer than industry experts expected. The dreaded words “allocation” and “double-ordering” are coming up more frequently, meaning OEMs and EMS providers are facing long-term sourcing challenges.

Kinetics of Moisture Sorption and Reverse Bias Degradation in Chip Tantalum Capacitors

source: ASRC Federal Space and Defense (NASA), EPCI e-Symposium Abstract: Exposure of chip MnO2 tantalum capacitors to humid environments might result in increased ESR, leakage currents, and first turn-on failures.  However, there is a lack of literature data on the effect of moisture on reverse bias behavior of the parts. The presence of moisture can […]