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    Skeleton Technologies’ Curved Graphene Succeeded at the Hugo Junkers Award 2019

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Supercapacitor Degradation and Reliability

5.12.2019
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Supercapacitor Degradation and Reliability
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source: Brno University of Technology CEITEC, EPCI e-Symposium

Abstract:

Degradation of supercapacitor (SC) is analyzed by accelerated aging test. Evolution of SC parameters is determined before the aging test, and during up to 8 x 105 cycles of both 75% and 100% energy cycling. Capacitance fading, equivalent series resistance (ESR) increase, and leakage current trend are analyzed for off-the-shelf CapXX SC.

Presented model consists of five parameters. These are Helmholtz and diffuse double layer capacitance, responsible for SC overall capacity. Next there is time dependent resistance in between Helmholtz and diffuse capacitance. And an ordinary ESR, and resistance responsible for SCs leakage current. Fading of both capacitance is modeled by exponential equation. Increase of ESR AC component is modeled by linear function.


Title: Supercapacitor Degradation and Reliability
Author(s): Tomas Kuparowitz, Vlasta Sedlakova, Josef Sikula, Jiri Majzner and Petr Sedlak
Organisation(s): Brno University of Technology, Central European Institute of Technology, Technicka 10, 616 00 Brno, Czech Republic
Symposium: 1st PCNS Passive Components Networking Days, 12-15th Sep 2017, Brno, Czech Republic
Reference: paper 3.3.  Supercapacitors Session., PCNS2017 Proceedings Pg.63-68
ISBN: 978-80-905 768-8-9
e-Sessions  Applications:
e-Sessions Scope Components: Capacitors
e-Sessions Topics: Measurement & Test, Simulation & Modelling


read the full paper in pdf here.

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