Thermal imaging of an emitter laser bar
The spatial and temperature resolutions and sensitivity reached by thermoreflectance techniques are excellent, however the accuracy of the absolute temperature readings is more difficult to evaluate due to the lack of comparable thermal techniques with submicrometric spatial resolution. Therefore, major applications of the technique on the microelectronics field, involves analyzing the relative temperature gradients on the surface devices and similar studies such as thermal mapping applications, thermal transport studies and hot spots analyses.
On the other hand, thanks to the high time resolution, ITT is also used for transient thermal imaging in switching devices or other systems under pulsed operation. This character is normally used to identify buried defects or help to extract the thermal resistance/capacitance network in the device, surrounding regions in the substrate and the package.
Proceeding 26th IEEE SEMI-THERM Symposium 978-1-4244-6460-9/10