Source: Knowles Capacitors blog
Knowles Capacitors explains the ins and outs of chips capacitors – their properties, product classifications, test standards, and use cases. In the next article, manufacturers’ MLCC chip visual standards are explained. (more…)
Source: Kemet Engineering Center blog
Capacitors are increasingly being recognized for having the potential to improve efficiency and, therefore, power density. Read the next article by Kemet Engineering Center about the ceramic technology guidelines for high power density circuits. (more…)
Source: EPCI e-Symposium PCNS paper
by Marcel Manofu (1), Radu Voina (2), Cătălin Negrea (1)
(1) Continental Automotive Romania
(2) Technical University of Cluj-Napoca
presented by M.Manofu at the 2nd PCNS 10-13th September 2019, Bucharest, Romania as paper 2.2.
Miniaturization leads to decreased supply voltages, which combined with higher current consumption of the integrated circuits (ICs) creates the need for more demanding power distribution network (PDN) requirements. The essential components in the PDN design are the decoupling capacitors. This paper presents an overview of multi-layer ceramic capacitors (MLCCs) characteristics that are of interest when used in power integrity (PI) analysis of automotive electronic systems. Design guidelines for decoupling capacitors selection and mounting board patterns are discussed by analyzing different types of capacitors and their parameter variations with DC voltage bias and temperature. (more…)
Source: EPCI e-symposium PCNS paper
By A. Yializis Ph.D., PolyCharge America Inc., Tucson, Arizona
the paper was presented at the 2nd PCNS 10-13th September 2019, Bucharest, Romania as paper 1.1.
The paper introduces development of NanoLamTM, solid state, polymer monolithic capacitors, comprising 1000s of nano-thick, cross-linked polymer dielectric layers. The NanoLam amorphous polymer dielectrics have an intrinsic breakdown strength >1000V/mm, can withstand temperatures >200°C and have stable capacitance and dissipation factor with temperature and DC bias .
Source: Kemet video
Do you ever have trouble getting accurate MLCC class II X5R, X7R … capacitance measurements from your LCR? Kemet Electronics on their YouTube video is showing some key settings of LCR meter to measure MLCC capacitors accurately. (more…)
Source: EE Journal article
Panasonic Industry Europe capacitors empower new Raspberry Pi microcomputer. (more…)
Source: Electrical Integrity article
Following EPCI initiative on MLCC BIAS issues investigation that is discussed during the PCNS 2019 symposium here, EPCI is pleased to get author’s permission to publish a paper written by Istvan Novak and col. about a real measurement on MLCC DC BIAS effect. Istvan Novak and his team in this paper measured characteristics on several different MLCC devices and compared their performance, including the effect of temperature. It will also be shown how the same nominal part from different vendors may behave very differently and also how some X7R capacitors may behave the same or even worse than X5R parts. The impact of measurement conditions, for instance preconditioning and/or dwell time, will be considered as well.
Original paper published at DesignCon East 2011 conference can be downloaded in pdf from Electrical Integrity web page here.
Source: EDN article
by Istvan Novak
Whether to think in the time domain or frequency domain, learn how to interpret capacitor manufacturer S-parameter models and how to apply them to your simulations. (more…)
Source: Design World article
By Mike Santora
Many factors increase the amount of “noise” interference that can damage or disturb the functionality of electronic devices. Today’s automobiles are a prime example. In a single vehicle, you can find Wi-Fi, Bluetooth, satellite radio, GPS systems, and that’s just the beginning. To manage this noise interference, the industry typically uses shielding along with EMI filters to eliminate unwanted noise. But now some of the traditional solutions for eliminating EMI/RFI are no longer sufficient. (more…)
Source: Knowles Precision Devices blog
Product durability and accelerated life cycle testing are all methods of determining the reliability of a product before release. By subjecting the capacitor to elevated conditions far beyond its normal operational ranges, we seek to discover any defects or points of failure to better inform customers about the limitations of the unit. (more…)
EPCI | Bringing Passive Professionals Together
Member of:
Proud partner & sponsor:
