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e-PassiveBlog
Molecular Memristor Shows Record 145 kH Emergent Inductance
Researchers from RIKEN Pioneering Research Institute, Nagoya University, and Tohoku University demonstrated in article published by Nature that a molecular...
Read moreDetailsPlanar vs Conventional Transformer: When it Make Sense
This article based on Frenetic webinar summarizes a practical design workflow using Frenetic AI, Frenetic Simulator and the new Planar...
Read moreDetailsEnergy Localization in Tantalum Anode Formation: A Structural Perspective
This article, authored by Vladimir Azbel, Ph.D., a semiconductor process reliability engineer consultant, provides deep inside explanation of energy dissipation during formation...
Read moreDetailsModeling Fringing Field Losses in Inductors & Transformers
Fringing field effects at air gaps represent a significant but often underestimated source of additional winding losses in magnetic components....
Read moreDetailsMiniaturization of Tantalum Capacitors: Structural Limit Under Constant Rating
This article, authored by Vladimir Azbel, Ph.D., a semiconductor process reliability engineer consultant, delves into the intricate process of miniaturizing tantalum...
Read moreDetailsHeatsink Design and Thermal Interface Materials for Reliable Electronics
Thermal management is a challenge for any electronics designer. Among the possible solutions, heatsinks are a key element that aids...
Read moreDetailsMurata New MLCC Bulk Case Packaging Cuts Packaging Material by 99%
Murata has introduced a new bulk case packaging format for ultra‑small multilayer ceramic capacitors (MLCCs) that dramatically reduces packaging material...
Read moreDetailsWhen More Capacitance Hurts Reliability: The Role of the Metallic Skeleton in Tantalum Anodes
This article, written by Vladimir Azbel, Ph.D., a semiconductor process reliability engineer consultant, delves into the significance of the metallic...
Read moreDetailsWhy Power Inductors Use a Ferrite Core With an Air Gap
This post is based on edited tutorial video by Sam Ben-Yaakov that provides an educational content about power inductor design...
Read moreDetailsAI-Assisted Structural Diagnostics and Physics-Based Reliability Interpretation of Tantalum Capacitor Anodes
This work by Vladimir Azbel Ph.D. Semiconductor Process Reliability Engineer Consultant, presents an AI-assisted framework for structural diagnostics and physics-based...
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