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    YAGEO Nexensos M422 Pb-free platinum RTD graphic showing the operating temperature range, nominal resistance options and joining methods.

    YAGEO Introduces Pb-Free Platinum RTD Temperature Sensor

    Reference tantalum capacitor anode characterization, tantalum anode modeling, process selection and life-test verification.

    Tantalum Anode Design Combines Structural Benchmarks and Modeling

    Wk 45 Electronics Supply Chain Digest

    SCHURTER TCS6F IP67 sealed SMD tactile switch with white silicone actuator on dark background

    SCHURTER Unveils IP67 Tactile Switch in 6.2 × 6.2 mm Package

    YAGEO SMD 0603 ST Pt1000 chip sensor shown in front of rooftop HVAC equipment

    YAGEO SMD 0603 ST Pt1000 Sensor with Standard SMD Termination

    Power line EMI filter on a copper ground-plane fixture connected to a vector network analyzer with a toroidal balun

    How to Measure Filter Performance: Insertion Loss, VNA Fixtures and CM/DM Separation

    Assorted EMI and RF filter components: common mode choke, ferrite beads, feedthrough filter, X2 capacitor, cavity filter, ceramic coaxial resonators, thin-film filter and SAW/BAW packages

    Passive Filter Technologies Compared: LC, Ferrite, Feedthrough, Ceramic, Cavity, Microstrip, SAW and BAW

    Illustration of a thin-film capacitor stack with TiN electrodes and an ultrathin hafnium zirconium oxide ferroelectric layer on silicon

    Sub-Volt Ferroelectric HZO Capacitor Pairs Speed and Endurance

    Cut-open lithium-ion capacitor pouch cell showing stacked carbon electrodes and separators, with vials of carbon powder

    Lithium-Ion Capacitor Review Backs Hard Carbon//AC Pairing

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    YAGEO Nexensos M422 Pb-free platinum RTD graphic showing the operating temperature range, nominal resistance options and joining methods.

    YAGEO Introduces Pb-Free Platinum RTD Temperature Sensor

    Reference tantalum capacitor anode characterization, tantalum anode modeling, process selection and life-test verification.

    Tantalum Anode Design Combines Structural Benchmarks and Modeling

    Wk 45 Electronics Supply Chain Digest

    SCHURTER TCS6F IP67 sealed SMD tactile switch with white silicone actuator on dark background

    SCHURTER Unveils IP67 Tactile Switch in 6.2 × 6.2 mm Package

    YAGEO SMD 0603 ST Pt1000 chip sensor shown in front of rooftop HVAC equipment

    YAGEO SMD 0603 ST Pt1000 Sensor with Standard SMD Termination

    Power line EMI filter on a copper ground-plane fixture connected to a vector network analyzer with a toroidal balun

    How to Measure Filter Performance: Insertion Loss, VNA Fixtures and CM/DM Separation

    Assorted EMI and RF filter components: common mode choke, ferrite beads, feedthrough filter, X2 capacitor, cavity filter, ceramic coaxial resonators, thin-film filter and SAW/BAW packages

    Passive Filter Technologies Compared: LC, Ferrite, Feedthrough, Ceramic, Cavity, Microstrip, SAW and BAW

    Illustration of a thin-film capacitor stack with TiN electrodes and an ultrathin hafnium zirconium oxide ferroelectric layer on silicon

    Sub-Volt Ferroelectric HZO Capacitor Pairs Speed and Endurance

    Cut-open lithium-ion capacitor pouch cell showing stacked carbon electrodes and separators, with vials of carbon powder

    Lithium-Ion Capacitor Review Backs Hard Carbon//AC Pairing

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Wurth Electronics Raises the Bar for EFTB Testing

17.1.2019
Reading Time: 1 min read
A A
Natural landscape and lightning striking the sky

Natural landscape and lightning striking the sky

Source: Wurth Electronic news

Watertown (USA), 17 January 2019 – Wurth Electronics is pleased to announce a new standard for EFTB testing. Electrical Fast Transient Burst (EFTB) is an electrical phenomenon, which plagues industrial environments.

RelatedPosts

YAGEO Introduces Pb-Free Platinum RTD Temperature Sensor

Tantalum Anode Design Combines Structural Benchmarks and Modeling

Wk 45 Electronics Supply Chain Digest

The EFTB waveform is a high-voltage, short-rise-time waveform different from typical surge or impulse requirements, which have longer rise times and duration. The specifics of the test can be found in IEC 61000-4-4. While this standard defines EFTB at the system level, Wurth Electronics has created a test method for the component level.

Jared Quenzer, Product Development Engineer at Wurth Electronics, explains “All magnetic suppliers give information about attenuation, but most cannot answer the questions: Can a regular CMC attenuate an EFTB signal? Which CMCs are better at attenuating EFTB? Can you predict, or simulate, CMC attenuation of EFTB?”

Quenzer is hoping this project will turn into regular testing for common mode chokes “This is why Wurth Electronics is the global leader in magnetics, to understand the “theory” while applying it in a practical way that can help our customers.”

Wurth Electronics and Schneider Electric have teamed up to research how common mode chokes attenuate this high-voltage, short-rise-time waveform.

Quenzer will be presenting at the Applied Power Electronics Conference (APEC) in March 2019, to explain this test method in more detail.

More information can be found at www.we-online.com/EFTB.

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