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    a Schematic diagram of the BNT-based components constructed based on the entropy-increase strategy. b Digital photograph, cross-sectional SEM image, and EDS mappings of the MLCCs. c Unipolar P-E loops of MLCCs as a function of applied E. d Wrec and η of the MLCCs as a function of applied E. The comparison of (e) Wrec and η, (f) η and UF of the MLCCs with those of other recently reported state-of-the-art MLCCs. source: Nature Communications

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    Researchers Demonstrated High Energy Ceramic Capacitors Stable in Wide Temperature Range

    Stackpole Offers High Voltage Plate Resistors up to 40KV

    How to Manage Supercapacitors Leakage Current and Self Discharge 

    Qualification of Commercial Supercapacitors for Space Applications

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    Resonant Capacitors in High-Power Resonant Circuits

    a Schematic diagram of the BNT-based components constructed based on the entropy-increase strategy. b Digital photograph, cross-sectional SEM image, and EDS mappings of the MLCCs. c Unipolar P-E loops of MLCCs as a function of applied E. d Wrec and η of the MLCCs as a function of applied E. The comparison of (e) Wrec and η, (f) η and UF of the MLCCs with those of other recently reported state-of-the-art MLCCs. source: Nature Communications

    Researchers Proposed Enhanced Energy Storage MLCC

    Littelfuse Releases First Reflow-Compatible Illuminated Tactile Switch

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    Coupled Inductors in SEPIC versus Flyback Converters

    Non-Linear MLCC Class II Capacitor Measurements Challenges

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Capacitors and Resistors with Extended Operating Temperature Range for GaN Applications– Development and Space Evaluation

2.3.2018
Reading Time: 2 mins read
A A
source: Alter Technology, ESA ESTEC, EPCI e-Symposium

Abstract:

During the last decade, a growing number of applications demanding higher power electrical consumption have emerged in some industrial sectors such as in the military, automotive or space ones. Consequently, electrical components with higher temperature range and rating voltage operation are needed. In addition, the good thermal characteristics of Silicon Carbide (SiC) and Gallium Nitride (GaN) allow the fabrication of devices suitable for working in extreme conditions.

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In order to satisfy these demands, an evaluation of selected capacitors and resistors for future space SiC & GaN applications is presented. They have extended temperatures ranges to the ones specified by manufacturers for current today’s applications. Under the framework of ESA Contract awarded by ALTER TECHNOLOGY, different families of tantalum and ceramic capacitors and thin, thick film and wraparound chip resistors were chosen from a compendium of market competitors according to their possible good performance for these applications.
For their evaluation, different tests were performed with the aim of constructing a derating curve with extended temperature conditions: firstly, a preliminary characterization including an initial destructive physical analysis, after destructive tests such as thermal shocks, voltage temperature (V-T) step stress processes, an accelerated life test of 2000 hours long and to conclude, a surge test determined by the ESCC Generic Specification No. 3012 were performed.
Relevant results as well as conclusions and recommendations are presented within this paper.

Title: Capacitors and Resistors with Extended Operating Temperature Range for GaN Applications– Development and Space Evaluation

Author(s): José Sánchez-del-Río(1), Juan Moreno(1), Enrique Cordero(1), Demetrio López(1), Léo Farhat (2), Denis Lacombe (2)
Organisation(s): (1) Alter Technology, St. La Majada 3V, 28760, Tres Cantos – Madrid – SPAIN
(2) ESA ESTEC, Keplerlaan 1, TEC-QTC, NL-2200 AG Noordwijk, The Netherlands
Symposium: 1st PCNS Passive Components Networking Days, 12-15th Sep 2017, Brno, Czech Republic
Reference: paper 5.1.  Applications Session., PCNS2017 Proceedings Pg.95-104
ISBN: 978-80-905 768-8-9
e-Sessions  Applications: Aerospace, Industrial, Automotive, Defense
e-Sessions Scope Components: Capacitors, Resistors
e-Sessions Topics: Specification & Qualification, Quality & Reliability


read the full paper in pdf here.

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