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    Overview of fabricated ferroelectric capacitors improving hyperdimensional computing task learning accuracy. a The experimental work reported in this study comprises ferroelectric capacitor (FeCAP) device fabrication, structural and electrical characterization, analog state identification and their reliability study. b The computational part of the work explores the benefits of using characteristics from the fabricated devices in a hyperdimensional computing scheme; source: authors

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    Overview of fabricated ferroelectric capacitors improving hyperdimensional computing task learning accuracy. a The experimental work reported in this study comprises ferroelectric capacitor (FeCAP) device fabrication, structural and electrical characterization, analog state identification and their reliability study. b The computational part of the work explores the benefits of using characteristics from the fabricated devices in a hyperdimensional computing scheme; source: authors

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Capacitors and Resistors with Extended Operating Temperature Range for GaN Applications– Development and Space Evaluation

2.3.2018
Reading Time: 2 mins read
A A
source: Alter Technology, ESA ESTEC, EPCI e-Symposium

Abstract:

During the last decade, a growing number of applications demanding higher power electrical consumption have emerged in some industrial sectors such as in the military, automotive or space ones. Consequently, electrical components with higher temperature range and rating voltage operation are needed. In addition, the good thermal characteristics of Silicon Carbide (SiC) and Gallium Nitride (GaN) allow the fabrication of devices suitable for working in extreme conditions.

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In order to satisfy these demands, an evaluation of selected capacitors and resistors for future space SiC & GaN applications is presented. They have extended temperatures ranges to the ones specified by manufacturers for current today’s applications. Under the framework of ESA Contract awarded by ALTER TECHNOLOGY, different families of tantalum and ceramic capacitors and thin, thick film and wraparound chip resistors were chosen from a compendium of market competitors according to their possible good performance for these applications.
For their evaluation, different tests were performed with the aim of constructing a derating curve with extended temperature conditions: firstly, a preliminary characterization including an initial destructive physical analysis, after destructive tests such as thermal shocks, voltage temperature (V-T) step stress processes, an accelerated life test of 2000 hours long and to conclude, a surge test determined by the ESCC Generic Specification No. 3012 were performed.
Relevant results as well as conclusions and recommendations are presented within this paper.

Title: Capacitors and Resistors with Extended Operating Temperature Range for GaN Applications– Development and Space Evaluation

Author(s): José Sánchez-del-Río(1), Juan Moreno(1), Enrique Cordero(1), Demetrio López(1), Léo Farhat (2), Denis Lacombe (2)
Organisation(s): (1) Alter Technology, St. La Majada 3V, 28760, Tres Cantos – Madrid – SPAIN
(2) ESA ESTEC, Keplerlaan 1, TEC-QTC, NL-2200 AG Noordwijk, The Netherlands
Symposium: 1st PCNS Passive Components Networking Days, 12-15th Sep 2017, Brno, Czech Republic
Reference: paper 5.1.  Applications Session., PCNS2017 Proceedings Pg.95-104
ISBN: 978-80-905 768-8-9
e-Sessions  Applications: Aerospace, Industrial, Automotive, Defense
e-Sessions Scope Components: Capacitors, Resistors
e-Sessions Topics: Specification & Qualification, Quality & Reliability


read the full paper in pdf here.

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