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    YAGEO SMD 0603 ST Pt1000 chip sensor shown in front of rooftop HVAC equipment

    YAGEO SMD 0603 ST Pt1000 Sensor with Standard SMD Termination

    Power line EMI filter on a copper ground-plane fixture connected to a vector network analyzer with a toroidal balun

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    YAGEO SMD 0603 ST Pt1000 chip sensor shown in front of rooftop HVAC equipment

    YAGEO SMD 0603 ST Pt1000 Sensor with Standard SMD Termination

    Power line EMI filter on a copper ground-plane fixture connected to a vector network analyzer with a toroidal balun

    How to Measure Filter Performance: Insertion Loss, VNA Fixtures and CM/DM Separation

    Assorted EMI and RF filter components: common mode choke, ferrite beads, feedthrough filter, X2 capacitor, cavity filter, ceramic coaxial resonators, thin-film filter and SAW/BAW packages

    Passive Filter Technologies Compared: LC, Ferrite, Feedthrough, Ceramic, Cavity, Microstrip, SAW and BAW

    Illustration of a thin-film capacitor stack with TiN electrodes and an ultrathin hafnium zirconium oxide ferroelectric layer on silicon

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Supercapacitor Degradation and Reliability

5.12.2019
Reading Time: 1 min read
A A
source: Brno University of Technology CEITEC, EPCI e-Symposium

Abstract:

Degradation of supercapacitor (SC) is analyzed by accelerated aging test. Evolution of SC parameters is determined before the aging test, and during up to 8 x 105 cycles of both 75% and 100% energy cycling. Capacitance fading, equivalent series resistance (ESR) increase, and leakage current trend are analyzed for off-the-shelf CapXX SC.

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Presented model consists of five parameters. These are Helmholtz and diffuse double layer capacitance, responsible for SC overall capacity. Next there is time dependent resistance in between Helmholtz and diffuse capacitance. And an ordinary ESR, and resistance responsible for SCs leakage current. Fading of both capacitance is modeled by exponential equation. Increase of ESR AC component is modeled by linear function.


Title: Supercapacitor Degradation and Reliability
Author(s): Tomas Kuparowitz, Vlasta Sedlakova, Josef Sikula, Jiri Majzner and Petr Sedlak
Organisation(s): Brno University of Technology, Central European Institute of Technology, Technicka 10, 616 00 Brno, Czech Republic
Symposium: 1st PCNS Passive Components Networking Days, 12-15th Sep 2017, Brno, Czech Republic
Reference: paper 3.3.  Supercapacitors Session., PCNS2017 Proceedings Pg.63-68
ISBN: 978-80-905 768-8-9
e-Sessions  Applications:
e-Sessions Scope Components: Capacitors
e-Sessions Topics: Measurement & Test, Simulation & Modelling


read the full paper in pdf here.

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