Smoltek CNF-MIM capacitors pass 1,000-hour reliability test, bringing commercialization closer.
Smoltek Semi has reached a significant technical milestone in the development of its carbon nanofiber-based CNF-MIM silicon wafer capacitor technology, successfully completing a rigorous 1,000-hour high-temperature durability test.
This accomplishment confirms the robustness and long-term reliability of Smoltek’s solution for advanced semiconductor applications.
“The results are extremely promising – they demonstrate that our CNF-MIM concept is not only high-performance, but also fundamentally reliable over time under realistic operating conditions. We have already shared the outcome with Yageo, and thanks to this progress, the next durability test will be carried out directly at their facilities,”
said Farzan Ghavanini, CTO of Smoltek.
Test Details and Results
The test was conducted on 20 CNF-MIM capacitors, each operated continuously for 1,000 hours at 85°C with a 2V bias—standard conditions for industry durability tests. After completion, none of the capacitors showed any noticeable change in capacitance. Importantly, 19 out of 20 units maintained insulation resistance above the target level of 1 GΩ, fully meeting industry criteria.
The single early outlier that did not meet the standard was already identified as having higher leakage before testing began—a situation known as an “infant failure.” Such units are typically screened out in a burn-in step prior to reliability testing, and Smoltek is now implementing this process to ensure all future units pass similar tests.
Industrialization and Path to Commercialization
These successful results strengthen Smoltek’s ongoing industrialization efforts with Yageo and additional potential partners, paving the way for the technology’s entry into commercial production. The next phase of durability testing will take place directly at Yageo’s facilities to accelerate this path.
