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    Percolation Phenomenon: Degradation of Molded Power Inductors in DC/DC Converters

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    Percolation Phenomenon: Degradation of Molded Power Inductors in DC/DC Converters

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    Percolation Phenomenon: Degradation of Molded Power Inductors in DC/DC Converters

    Molex Acquires Smiths Interconnect

    Murata Integrates Component Models into Cadence EDA Tools

    Wk 42 Electronics Supply Chain Digest

    Stackpole Introduces Automotive Thick Film Wide Termination Chip Resistors

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    Bourns Release Automotive 4-Terminal Shunt Resistors

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    Percolation Phenomenon: Degradation of Molded Power Inductors in DC/DC Converters

    Connector PCB Design Challenges

    Efficient Power Converters: Duty Cycle vs Conduction Losses

    Ripple Steering in Coupled Inductors: SEPIC Case

    SEPIC Converter with Coupled and Uncoupled Inductors

    Coupled Inductors in SEPIC versus Flyback Converters

    Non-Linear MLCC Class II Capacitor Measurements Challenges

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Researchers Developed High Conductive Nanowires

20.1.2025
Reading Time: 2 mins read
A A
A film a few atoms thick of non-crystalline niobium phosphide conducts better through the surface to make the material, as a whole, a better conductor. | Il-Kwon Oh / Asir Khan

A film a few atoms thick of non-crystalline niobium phosphide conducts better through the surface to make the material, as a whole, a better conductor. | Il-Kwon Oh / Asir Khan

Researchers at Stanford Engineering have achieved a significant breakthrough by developing an ultrathin material, niobium phosphide, that surpasses copper in conducting electricity across films just a few atoms thick.

This advancement could revolutionize nanoelectronics by enabling more energy-efficient and powerful devices.

RelatedPosts

Percolation Phenomenon: Degradation of Molded Power Inductors in DC/DC Converters

Molex Acquires Smiths Interconnect

Murata Integrates Component Models into Cadence EDA Tools

The Challenge with Copper

As computer chips shrink, the metallic wires that transmit electrical signals become less efficient, particularly when reduced below 50 nanometers. Copper struggles to maintain electrical conduction at these dimensions, leading to power losses and inefficiencies in nanoscale electronics.

Niobium Phosphide: A Promising Alternative

Niobium phosphide, a topological semimetal, conducts electricity better than copper at thicknesses below 5 nanometers, even at room temperature. Unlike traditional metals, its conductivity improves as it becomes thinner. This unique property can significantly enhance the performance of high-density electronic devices.

Advantages Over Traditional Methods

Unlike other materials requiring high-temperature deposition to form precise crystalline structures, niobium phosphide films can be created at relatively low temperatures (400°C). This process is compatible with existing silicon-based technologies and avoids the need for perfect crystalline wires.

Future Implications and Research

While not ready to replace copper universally, niobium phosphide offers a compelling solution for the thinnest connections in chips. Researchers are exploring other topological semimetals to enhance its conductivity further.

Stanford’s team, including notable contributors such as Eric Pop, Yuri Suzuki, and Xiangjin Wu, continues to investigate how niobium phosphide and similar materials can improve energy efficiency in electronic devices. By developing narrow wires and testing real-world applications, they aim to address power challenges in current and future electronics.

Read the full paper here:

Asir Intisar Khan et al. ,Surface conduction and reduced electrical resistivity in ultrathin noncrystalline NbP semimetal.Science 387,62-67(2025).DOI:10.1126/science.adq7096

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Source: Stanford Engineering

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a Schematic diagram of the BNT-based components constructed based on the entropy-increase strategy. b Digital photograph, cross-sectional SEM image, and EDS mappings of the MLCCs. c Unipolar P-E loops of MLCCs as a function of applied E. d Wrec and η of the MLCCs as a function of applied E. The comparison of (e) Wrec and η, (f) η and UF of the MLCCs with those of other recently reported state-of-the-art MLCCs. source: Nature Communications

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