Post Procurement Testing of EEE Components for LEO Space Applications
Post Procurement Testing of EEE Components for LEO Space Applications
Join ALTER TECHNOLOGY webinar on optimized test flows for EEE components in LEO applications.
July 28th 2026 at 11:00 CET
This technical session will address the rationale behind preparing and implementing optimized test flows for EEE components procured off the shelf as Space, Military, or Commercial Quality Level parts for Low Earth Orbit missions.
The webinar will present non-traditional test flow approaches compared with official NASA/ESA space specifications for these quality levels. Their implementation remains under the full responsibility of the user and must be assessed according to each mission’s technical requirements.
The session will also discuss a component selection and approval policy that gives first priority to COTS solutions. Depending on the specific component type and the available supporting database, engineering judgement may take precedence over the general policy or the proposed test flow.
Two generations of test flows will be presented:
- 1st Generation: a test flow supported by two and a half decades of successful space heritage.
- 2nd Generation: a proposed optimized test flow based on lessons learned from the use of COTS in space, as technically interpreted by the author.
Register now to discover how optimized, experience-based test flows can support more efficient and technically sound component selection for LEO missions.
Agenda or topics to be covered during the session.
The webinar addresses the technical rational for preparing and implementing optimized test flows for EEE Components, procured off the shelf as Space, Military, Commercial Quality Level for LEO applications. The presented test flows are non-traditional vs. the official NASA/ESA Space Specs dedicated to all the above-mentioned quality levels. The test flows and their implementation are under full responsibility of the user.
The policy of the selection and approval of the to be flown components is based on first-priority given to COTS.
Case by case, as per a specific component type and/or related supporting database, engineering judgement may take precedence over the general mentioned policy and or the related test flow.
Two generations of test flows are presented:
Gen, 1 a test flow with two and a half decades of successful space heritage.
Gen. 2 a proposed test flow optimized as per lessons learnt from use of COTS in space, as technically (not politically biased) understood by the author, as user.
The webinar addresses the technical rational for preparing and implementing optimized test flows for EEE Components, procured off the shelf as Space, Military, Commercial Quality Level for LEO applications. The presented test flows are non-traditional vs. the official NASA/ESA Space Specs dedicated to all the above-mentioned quality levels. The test flows and their implementation are under full responsibility of the user.
The policy of the selection and approval of the to be flown components is based on first-priority given to COTS.
Case by case, as per a specific component type and/or related supporting database, engineering judgement may take precedence over the general mentioned policy and or the related test flow.
Two generations of test flows are presented:
Gen, 1 a test flow with two and a half decades of successful space heritage.
Gen. 2 a proposed test flow optimized as per lessons learnt from use of COTS in space, as technically (not politically biased) understood by the author, as user.
The addressed issues are:
- The task of traditional 100% testing.
- The burden of COTS post procurement testing falls on the user.
- Global Developments leading away from the traditional methodology.
- The need for Cultural Change to use advanced technologies, penalized by the traditional thinking.
- New approach is needed.
- New Methodology is needed.
- Post Procurement activities and their scope.
- Sampling vs. 100% testing.
- Statistical Process Control (SPC) targeting failures prevention.
- Decision making, overcoming risk fear.
- Elimination of justified non-value-added (NVA) testing.
- Testing activities for the relevant quality levels.
- Tests addressing quality vs. tests addressing reliability.
- Gen. 2 vs. Gen. 1 DPA test flow for passive.
- Gen. 2 vs. Gen. 1 DPA test flow for hermetic active.
- Gen. 2 vs. Gen. 1 DPA test flow for PEMs.
- Gen. 1 Upscreening Test Flow for all Components, except semiconductors.
- Gen, 1 Upscreening Test Flow for semiconductors, except PEMs.
- Gen. 1 Upscreening Test Flow for PEMs.
- Gen. 2 Upscreening Test Flow.
- Upscreening sampling.
- DPA sampling.
- Conclusions.
- Summary.
Presenter: Dan Friedlander, EEE Components industry consultant.
