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News
KYOCERA AVX Releases NTN Antenna Selection Guide Brochure
Non‑terrestrial networks (NTN) are rapidly becoming a core connectivity option for IoT and wireless devices operating beyond the reach of...
Read moreDetailsCoilcraft Releases 0402 Ferrite-Core Wirewound Chip Inductors for RF and EMI Control
Coilcraft introduces 016008F ferrite-core wirewound chip inductors - ultra‑miniature RF chokes in 0402 (metric 01005) format, designed for high‑frequency circuits...
Read moreDetailsDigiKey Releases Season Two of Sustainable Futures Series
DigiKey has released the second season of its Sustainable Futures video series, focusing on how advanced electronics enable cleaner energy,...
Read moreDetailsUsing a Virtual Anode Thermal Model to Evaluate Miniaturization Risk in Tantalum Capacitors
In this article, Dr. Vladimir Azbel presents a virtual anode thermal model that allows engineers to evaluate how far a tantalum...
Read moreDetailsBourns Introduced High-Current Coupled Inductor for 48 V Hybrid and IBC Converters
Bourns has introduced the MAG-3002562, a high-current coupled inductor optimized for 48 V to 12 V DC-DC conversion in hybrid...
Read moreDetailsWürth Elektronik Expands Nanocrystalline Cable Cores for Broadband EMI Suppression
Nanocrystalline cable cores of the WE‑NCC series from Würth Elektronik are designed for broadband suppression of conducted electromagnetic interference on...
Read moreDetailsHigh‑Speed Supercapacitor Balancing for AI Data Center Power Systems
The rapid adoption of artificial intelligence is reshaping the electrical profile of modern data centers. Unlike legacy compute workloads, AI...
Read moreDetailsBourns Introduced Automotive TVS Diodes for Compact ESD Protection
Bourns has introduced the CDSOD323-TxxC-Q Series, an automotive‑grade bidirectional TVS diode family targeting ESD and surge protection on single high‑speed...
Read moreDetailsEMC‑Compliant PCB and Connector Design Guidelines
Electromagnetic compatibility (EMC) is decided in the schematic and layout, not in the test chamber. This article distills key lessons...
Read moreDetailsPractical Value of Structural Diagnostics for Tantalum Capacitor Anodes
This article, written by Vladimir Azbel, Ph.D., a semiconductor process reliability engineering consultant, and adapted and edited for passive-components.eu, rovides an overview...
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