The paper “Protecting the Quality & Reliability of Passive (and Active) Components: the J-STD-075 PSL Classification & Labeling” was presented...
Read moreDetailsThe paper “New Generation of Metallized Film Capacitors Based on EPN for Solving Upcoming High Temperature and High Power Density...
Read moreDetailsThis article by Dr. V. Azbel, an Independent consultant on tantalum capacitors discusses role of internal stress to reliability of tantalum capacitors. Abstract...
Read moreDetailsThe paper “Quality Challenges and Risk Mitigation for Passive Components in Harsh Environments” was presented by Antonio Rodríguez Arenas, ALTER...
Read moreDetailsThe paper “Muratas Silicon Capacitors: Reliable Performance in Extreme Conditions" was presented by Enzo Darcy, Caen, France at the 5th...
Read moreDetailsThe paper “Tantalum Capacitor Technology Advantages for Harsh Environment” was presented by Michel Bouvier, Vishay Europe, Le Pecq, France at the...
Read moreDetailsThe paper “Thermoset Polymer Dielectric Capacitors for Harsh Environment Applications ” was presented by Angelo Yializis, PolyCharge America Inc. Tucson, AZ,...
Read moreDetailsThis article based on TDK blog article discus a technical perspective of EMI electromagnetic noise mitigation in automotive 48v power...
Read moreDetailsThe paper “AI Hardware Development and Its Consequences for Passive Electronic Components” was presented by Tomas Zednicek, EPCI European Passive Components...
Read moreDetailsThe paper “Passive Components in AI Systems” was presented by Slavomir Pala, KYOCERA AVX Lanskroun, Czech Republic at the 5th PCNS Passive...
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