Name: To Ferrite or to Nanocrystalline in Transformer Design
Start: 2026-07-29T17:30:00+02:00
End: 2026-07-29T18:30:00+02:00
Location: virtual

Enabling the 800 V AI Server Era: How C0G High-Voltage MLCC Supports Next-Generation Power Architectures

1.7.2026

182

This article, edited from original article by Mark Laps, MLCC specialist at YAGEO Group, reviews why the industry is converging...

Using a Virtual Anode Thermal Model to Evaluate Miniaturization Risk in Tantalum Capacitors

24.6.2026

60

In this article, Dr. Vladimir Azbel presents a virtual anode thermal model that allows engineers to evaluate how far a tantalum...

Practical Value of Structural Diagnostics for Tantalum Capacitor Anodes

22.6.2026

43

This article, written by Vladimir Azbel, Ph.D., a semiconductor process reliability engineering consultant, and adapted and edited for passive-components.eu, rovides an overview...

Ultrahigh Energy Storage in Lead‑Free BiFeO₃‑Based Ceramic Capacitors via Local Polar Structure Design

16.6.2026

42

Researchers Ji Zhang, and col., working in materials science and electronic ceramics research institutions in China and Australia published their...

All‑Water Supercapacitor Based on 1‑nm Clay Channels and Nanoconfined Water Electrolyte

10.6.2026

77

Researchers in Europe with expertise in nanofluidics, electrochemistry, clay mineralogy, and electron microscopy to design and characterize a new type...

How Long-Term Storage Causes Aging in Electronic Components

26.5.2026

235

Electronic components are often treated as static building blocks once sealed in bags and placed on warehouse shelves. In reality,...

Mechanical SSC Testing as a Structural Diagnostic Tool for Tantalum Capacitor Anodes

25.5.2026

164

This article, written by Vladimir Azbel, Ph.D., a semiconductor process reliability engineering consultant, and adapted and edited for passive-components.eu, reviews mechanical SSC...

Using Stress–Strain Curves to Diagnose Tantalum Powders for Capacitors

20.5.2026

68

This article based on edited report written by Vladimir Azbel, Ph.D., a semiconductor process reliability engineer consultant, explains and discuss why stress–strain curves...

Two‑capacitor paradox explained for engineers

18.5.2026

243

This article based on prof. Sam Ben-Yaakov video explains so‑called two‑capacitor paradox theory and practical implications to hardware designers. The...