Source: Knowles Capacitors blog
Knowles Capacitors explains the ins and outs of chips capacitors – their properties, product classifications, test standards, and use cases. In the next article, manufacturers’ MLCC chip visual standards are explained. (more…)
Source: EPCI e-Symposium PCNS paper
by Roland Chavasse, T.I.C. Tantalum-Niobium International Study Center
presented by Roland Chavasse at the 2nd PCNS Symposium 10-13th September 2019, Bucharest, Romania as paper 4.5. within TOP 5 Best Rated Paper rated by PCNS attendees !
This essay will explain how, over the last decade, supply chain risks in the tantalum industry have decreased considerably and, as a result, consumers of tantalum can have greater confidence in the reliable supply of tantalum, both now and in the future. This is important, as recent trends in the electronics market, and structural changes in capacity availability for certain capacitor types, have caused the market to turn to tantalum-based capacitors to fill the gap. (more…)
Source: EPCI e-Symposium PCNS paper
by Vlasta Sedlakova, Josef Sikula, Jiri Majzner, Petr Sedlak
CEITEC, Brno University of Technology, Brno, Czech Republic
presented by V.Sedlakova at the 2nd PCNS 10-13th September 2019, Bucharest, Romania as paper 3.4.
Degradation of supercapacitor (SC) is evaluated during aging tests. Continuous current cycling for 100% energy and 75% energy and discontinuous cycling for 75% energy, respectively, was performed on two different types of supercapacitors. SC parameters are determined before the aging test, and during 6×105 cycles of all three current cycling tests.
Capacitance fading within the current cycling tests is correlated to the results of capacitance change within the calendar life tests at different temperatures and operating voltage. Two studied SCs technologies show different sensitivity to temperature and electric field during the calendar tests as well as slightly different evolution of capacitance during cycling. We show that the capacitance fading is driven by two mechanisms. (more…)
Source: EPCI e-Symposium PCNS paper
by Alexander Teverovsky; Jacobs Technology Inc. NASA GSFC, USA
presented by A.Teverovsky at the 2nd PCNS 10-13th September 2019, Bucharest, Romania as paper 5.1.
One of the major benefits of chip polymer tantalum capacitors (CPTCs) compared to conventional MnO2 capacitors is reduction of the equivalent series resistance (ESR). Reduction of ESR improves the efficiency of parts for filtering in power lines and decreases self-heating in capacitors resulting in lower operating temperatures and probability of failure. A substantial improvement in performance of tantalum capacitors was achieved with introduction of conductive polymers based on poly(3,4-ethylenedioxythiophene), PEDOT [1], as a cathode materials. (more…)
Source: EPCI e-Symposium PCNS paper
by Luca Primavesi (1) and Saverio Latorrata (2)
1) Itelcond, Settimo Milanese, Italy 2) Politecnico di Milano, Milan, Italy
presented by L.Primavesi at the 2nd PCNS 10-13th September 2019, Bucharest, Romania as paper 3.3.
The aim of this work is to estimate the expected lifetime of a capacitor without basing reliability evaluation just on handbook based predictions. This approach is meant to overtake the non-homogeneous End of Life criteria proposed by the manufacturers and the difference between the real working condition in the application and the standardized condition of the criteria, as well.To obtain this result, the measured degradation of the electrical parameters of capacitors, such as Capacitance and ESR, is compared with a physical chemical model, whose constants are previously determined by accelerated stress tests (ASTs). (more…)
by: EPCI e-Symposium PCNS paper
by Y. Freeman, P. Lessner, E. Jones; KEMET Electronics
presented by Ed Jones at the 2nd PCNS 10-13th September 2019, Bucharest, Romania as paper 3.2.
Commercial space constellations are an example of the increasing share of the space applications looking for more affordable electronics [1.] According to [1] selecting traditional space parts under MIL SPEC not only increases cost, but also leads to older technologies and larger packages. As an alternative, selecting parts that are not MIL SPEC, e.g., automotive parts, allows cost reduction as well as maximum flexibility including additional test requirements aligned with the program requirements. The internal evaluation by the end-user as well as usage of the application stress factors such as derating should insure reliability of the commercial parts in space application. (more…)
Source: Kemet Engineering Center blog
Capacitors are increasingly being recognized for having the potential to improve efficiency and, therefore, power density. Read the next article by Kemet Engineering Center about the ceramic technology guidelines for high power density circuits. (more…)
Source: EPCI e-Symposium PCNS paper
by Marcel Manofu (1), Radu Voina (2), Cătălin Negrea (1)
(1) Continental Automotive Romania
(2) Technical University of Cluj-Napoca
presented by M.Manofu at the 2nd PCNS 10-13th September 2019, Bucharest, Romania as paper 2.2.
Miniaturization leads to decreased supply voltages, which combined with higher current consumption of the integrated circuits (ICs) creates the need for more demanding power distribution network (PDN) requirements. The essential components in the PDN design are the decoupling capacitors. This paper presents an overview of multi-layer ceramic capacitors (MLCCs) characteristics that are of interest when used in power integrity (PI) analysis of automotive electronic systems. Design guidelines for decoupling capacitors selection and mounting board patterns are discussed by analyzing different types of capacitors and their parameter variations with DC voltage bias and temperature. (more…)
Source: EPCI e-symposium PCNS paper
By A. Yializis Ph.D., PolyCharge America Inc., Tucson, Arizona
the paper was presented at the 2nd PCNS 10-13th September 2019, Bucharest, Romania as paper 1.1.
The paper introduces development of NanoLamTM, solid state, polymer monolithic capacitors, comprising 1000s of nano-thick, cross-linked polymer dielectric layers. The NanoLam amorphous polymer dielectrics have an intrinsic breakdown strength >1000V/mm, can withstand temperatures >200°C and have stable capacitance and dissipation factor with temperature and DC bias .
Source: Kemet video
Do you ever have trouble getting accurate MLCC class II X5R, X7R … capacitance measurements from your LCR? Kemet Electronics on their YouTube video is showing some key settings of LCR meter to measure MLCC capacitors accurately. (more…)
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